CHATHAM, NJ - James and Christian Doucette, eighth-grade twins from Chatham, have been recognized by the Johns Hopkins University Center for Talented Youth (CTY).

Johns Hopkins selects students for their exceptional testing performance as middle school students on the college SAT, ACT or a similar test. Both boys attend Chatham Day School.

CTY uses above-grade-level tests (such as the college SAT for middle school students) because they provide a clear picture of advanced students’ academic abilities. Nearly 18,000 middle school students participated in the program this year and 1,075 (including the Doucette twins) were recognized for their achievement.

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Students honored with this recognition may attend CTY’s residential summer programs, online classes, and family academic programs. At CTY, academically advanced students–-who come from some 100 countries around the world–-meet others like them and form a community of learners.

Dr. Pamela Fiander, head of school praised the boys' achievement. “James and Christian have brought national recognition to the work being done here at Chatham Day School and we honor them, their parents, and the faculty," Fiander said.

In a letter to Fiander, Elaine Hansen, executive director of CTY, pointed out that “human intelligence is a force that knows no geographical or linguistic or ideological distinctions. We recognize these young students for their remarkable achievements. We also honor the parents and educators who have helped these promising young people on their road to success.“

James and Christian, sons of John and Keillie Doucette, attend Chatham Day School with their sister Ashlie, who is in the fifth grade. In addition to their academic achievement, they are also both musicians, and have played classical violin since the age of 5. They are on the cross-country team and are avid tennis players.

Chatham Day School enrolls students from more than 30 nearby communities, and is accredited by the Middle States Association of Colleges and Schools, NJAIS, and is a member of NAIS. To learn more, visit